TY - JOUR
T1 - Automated Real-Space Lattice Extraction for Atomic Force Microscopy Images
AU - Corrias, Marco
AU - Papa, Lorenzo
AU - Sokolović, Igor
AU - Birschitzky, Viktor
AU - Gorfer, Alexander
AU - Setvín, Martin
AU - Schmid, Michael
AU - Diebold, Ulrike
AU - Reticcioli, Michele
AU - Franchini, Cesare
N1 - Publisher Copyright:
© 2023 The Author(s). Published by IOP Publishing Ltd.
PY - 2023/2/8
Y1 - 2023/2/8
N2 - Analyzing atomically resolved images is a time-consuming process requiring solid experience and substantial human intervention. In addition, the acquired images contain a large amount of information such as crystal structure, presence and distribution of defects, and formation of domains, which need to be resolved to understand a material’s surface structure. Therefore, machine learning techniques have been applied in scanning probe and electron microscopies during the last years, aiming for automatized and efficient image analysis. This work introduces a free and open source tool (AiSurf: Automated Identification of Surface Images) developed to inspect atomically resolved images via scale-invariant feature transform and clustering algorithms. AiSurf extracts primitive lattice vectors, unit cells, and structural distortions from the original image, with no pre-assumption on the lattice and minimal user intervention. The method is applied to various atomically resolved non-contact atomic force microscopy images of selected surfaces with different levels of complexity: anatase TiO
2(101), oxygen deficient rutile TiO
2(110) with and without CO adsorbates, SrTiO
3(001) with Sr vacancies and graphene with C vacancies. The code delivers excellent results and is tested against atom misclassification and artifacts, thereby facilitating the interpretation of scanning probe microscopy images.
AB - Analyzing atomically resolved images is a time-consuming process requiring solid experience and substantial human intervention. In addition, the acquired images contain a large amount of information such as crystal structure, presence and distribution of defects, and formation of domains, which need to be resolved to understand a material’s surface structure. Therefore, machine learning techniques have been applied in scanning probe and electron microscopies during the last years, aiming for automatized and efficient image analysis. This work introduces a free and open source tool (AiSurf: Automated Identification of Surface Images) developed to inspect atomically resolved images via scale-invariant feature transform and clustering algorithms. AiSurf extracts primitive lattice vectors, unit cells, and structural distortions from the original image, with no pre-assumption on the lattice and minimal user intervention. The method is applied to various atomically resolved non-contact atomic force microscopy images of selected surfaces with different levels of complexity: anatase TiO
2(101), oxygen deficient rutile TiO
2(110) with and without CO adsorbates, SrTiO
3(001) with Sr vacancies and graphene with C vacancies. The code delivers excellent results and is tested against atom misclassification and artifacts, thereby facilitating the interpretation of scanning probe microscopy images.
KW - cond-mat.mtrl-sci
KW - cond-mat.other
KW - clustering algorithm
KW - scanning probe microscopy
KW - computer vision
KW - surface science
KW - atomic force microscopy
KW - machine learning
KW - unsupervised learning
UR - http://www.scopus.com/inward/record.url?scp=85148236605&partnerID=8YFLogxK
U2 - 10.1088/2632-2153/acb5e0
DO - 10.1088/2632-2153/acb5e0
M3 - Article
SN - 2632-2153
VL - 4
JO - Machine Learning: Science and Technology
JF - Machine Learning: Science and Technology
IS - 1
M1 - 015015
ER -