Characterization of nanostructured materials by X-ray Line Profile Analysis

Erhard Schafler, Michael Zehetbauer

    Veröffentlichungen: Beitrag in FachzeitschriftArtikelPeer Reviewed

    Abstract

    For the characterisation of micro- and nanostructures in bulk as well as in loose powder materials the X-ray Line Profile Analysis (XPA) has proven to be ah excellent method. In the last two decades not only the evaluation procedures have been improved extensively, but also the instrumentation like X-ray generators, monochromators and detectors have been developed further. The application of XPA on a variety of nanostru ctured materials produced by different methods demonstrates the ability to characterise the micro-/nanostructure in terms of structural size and its distribution and lattice defect densities. © 2005 Advanced Study Center Co. Ltd.
    OriginalspracheEnglisch
    Seiten (von - bis)28-33
    Seitenumfang6
    FachzeitschriftReviews on Advanced Materials Science
    Jahrgang10
    Ausgabenummer1
    PublikationsstatusVeröffentlicht - 2005

    ÖFOS 2012

    • 1030 Physik, Astronomie

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