TY - JOUR
T1 - Characterization of nanostructured materials by X-ray Line Profile Analysis
AU - Schafler, Erhard
AU - Zehetbauer, Michael
N1 - Affiliations: Institute of Materials Physics, University of Vienna, Boltzmanngasse 5, A-1090 Vienna, Austria
Adressen: Schafler, E.; Institute of Materials Physics; University of Vienna; Boltzmanngasse 5 A-1090 Vienna, Austria; email: [email protected]
Import aus Scopus: 2-s2.0-23944458207
04.12.2007: Datenanforderung 2001 (Import Sachbearbeiter)
PY - 2005
Y1 - 2005
N2 - For the characterisation of micro- and nanostructures in bulk as well as in loose powder materials the X-ray Line Profile Analysis (XPA) has proven to be ah excellent method. In the last two decades not only the evaluation procedures have been improved extensively, but also the instrumentation like X-ray generators, monochromators and detectors have been developed further. The application of XPA on a variety of nanostru ctured materials produced by different methods demonstrates the ability to characterise the micro-/nanostructure in terms of structural size and its distribution and lattice defect densities. © 2005 Advanced Study Center Co. Ltd.
AB - For the characterisation of micro- and nanostructures in bulk as well as in loose powder materials the X-ray Line Profile Analysis (XPA) has proven to be ah excellent method. In the last two decades not only the evaluation procedures have been improved extensively, but also the instrumentation like X-ray generators, monochromators and detectors have been developed further. The application of XPA on a variety of nanostru ctured materials produced by different methods demonstrates the ability to characterise the micro-/nanostructure in terms of structural size and its distribution and lattice defect densities. © 2005 Advanced Study Center Co. Ltd.
M3 - Article
SN - 1606-5131
VL - 10
SP - 28
EP - 33
JO - Reviews on Advanced Materials Science
JF - Reviews on Advanced Materials Science
IS - 1
ER -