TY - GEN
T1 - Detection of sputtered molecular doubly charged anions: A comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)
AU - Gnaser, Hubert
AU - Golser, Robin
AU - Kutschera, Walter
AU - Priller, Alfred
AU - Vockenhuber, Christof
AU - Steier, Peter
N1 - Zeitschrift: Applied Surface Science
DOI: 10.1016/j.apsusc.2004.03.084
Coden: ASUSE
Affiliations: Fachbereich Physik, Universität Kaiserslautern, D-67663 Kaiserslautern, Germany; Vienna Environ. Research Accelerator, Inst. fur Isotopenforsch./Kernphys., Universität Wien, Währinger Straße 17, A-1090 Vienna, Austria
Adressen: Gnaser, H.; Fachbereich Physik; Universität Kaiserslautern D-67663 Kaiserslautern, Germany; email: [email protected]
Import aus Scopus: 2-s2.0-2942597871
PY - 2004
Y1 - 2004
N2 - The detection of small molecular dianions by secondary-ion mass spectrometry (SIMS) and by accelerator mass spectrometry (AMS) is compared. In SIMS, the existence of these dianions can be identified safely if the total mass number of the molecule is odd and the dianion is hence detected at a half-integral mass number. The occurrence of fragmentation processes which may interfere with this scheme, is illustrated by means of the energy spectra of singly and doubly charged negative cluster ions. As compared to SIMS, AMS can rely, in addition, on the break-up of molecular species in the stripping process: this allows to monitor the simultaneous arrival of several atomic constituents with a clear energetic pattern in coincidence at the detector. This feature is exemplified for the C102- dianion. © 2004 Published by Elsevier B.V.
AB - The detection of small molecular dianions by secondary-ion mass spectrometry (SIMS) and by accelerator mass spectrometry (AMS) is compared. In SIMS, the existence of these dianions can be identified safely if the total mass number of the molecule is odd and the dianion is hence detected at a half-integral mass number. The occurrence of fragmentation processes which may interfere with this scheme, is illustrated by means of the energy spectra of singly and doubly charged negative cluster ions. As compared to SIMS, AMS can rely, in addition, on the break-up of molecular species in the stripping process: this allows to monitor the simultaneous arrival of several atomic constituents with a clear energetic pattern in coincidence at the detector. This feature is exemplified for the C102- dianion. © 2004 Published by Elsevier B.V.
U2 - 10.1016/j.apsusc.2004.03.084
DO - 10.1016/j.apsusc.2004.03.084
M3 - Contribution to proceedings
T3 - Applied Surface Science
SP - 117
EP - 121
BT - Proceedings of the Fourteenth International Conference on Secondary IOn Mass Spectrometry and Related Topics
A2 - Benninghoven , A.
PB - Elsevier BV, North-Holland
CY - Amsterdam [u.a.]
ER -