Field-assisted oxidation of rhodium

Jean-Sabin Mc Ewen (Korresp. Autor*in), P. Gaspard, Florian Mittendorfer, Thierry Visart de Bocarme, Norbert Kruse

Veröffentlichungen: Beitrag in FachzeitschriftArtikelPeer Reviewed

Abstract

The oxidation of nanosized rhodium facets is investigated in the presence of a high external electric field with field ion microscopy experiments (FIM). Corresponding density functional theory (DFT) calculations were done on Rh(0 0 1), Rh(0 1 1) and Rh(1 1 1). A cross-like granular structure is obtained with FIM when the electric field is increased from 11 to 12.3 V/nm, which strongly indicates that the field promotes the oxidation of the tip. The DFT calculations confirm this scenario with a corresponding reduction of the activation barrier for oxygen incorporation into the surface of an oxide layer. © 2007 Elsevier B.V. All rights reserved
OriginalspracheEnglisch
Seiten (von - bis)133-138
Seitenumfang6
FachzeitschriftChemical Physics Letters
Jahrgang452
Ausgabenummer1-3
DOIs
PublikationsstatusVeröffentlicht - 2008

ÖFOS 2012

  • 1030 Physik, Astronomie

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