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The Phase Stability, Phase Transformation, and Reactive Phase Formation in Electronic
Materials symposium covers the stability, transformation, and formation of phases during the
fabrication, processing, and utilization of electronic materials and devices. Since 2002, this
symposium has been an important and active part of the TMS Annual Meeting, providing a
platform for interaction and discussion among industrial experts and academic scholars from
all over the world.
This year, this symposium was held from February 14 to 18, 2010, in Seattle, WA, USA.
Authors from various countries contributed 36 oral presentations in four sessions including
ten invited talks, and many authors submitted original manuscripts based on their work.
Papers were selected for this special issue after critical peer review and careful manuscript
revision. The collected papers discuss phase-related issues in Pb-free solders, dielectrics, and
interconnect materials. The organizers are grateful to all the invited and contributed speakers
for their participation in this symposium and acknowledge all the efforts of authors and
reviewers for making this special issue possible. The organizers especially thank Professor
Suzanne Mohney, the editor-in-chief, for her assistance in the review and publication process.
This year is the ninth year of this symposium. Next year we will continue to organize this
symposium for its tenth year. We sincerely welcome all the participants, and readers are also
very welcome to attend this symposium, which will be held from February 27 to March 3,
2011, at the TMS Annual Meeting in San Diego, CA, USA.