High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

Lukas W. Perner; Gar-Wing Truong; David Follman; Maximilian Prinz; Georg Winkler; Stephan Puchegger; Garrett D. Cole; Oliver H. Heckl

doi:10.1109/CLEO/Europe-EQEC57999.2023.10232458

High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

Lukas W. Perner (Korresp. Autor*in), Gar-Wing Truong, David Follman, Maximilian Prinz, Georg Winkler, Stephan Puchegger, Garrett D. Cole, Oliver H. Heckl

Fakultätszentrum für Nanostrukturforschung

Veröffentlichungen: Beitrag in Buch › Beitrag in Konferenzband › Peer Reviewed

Abstract

Accurate knowledge of the refractive index, n, of optical materials is required for the development of many optical devices in the visible (VIS), near- (NIR) and mid-infrared (MIR) spectral regions, such as lasers, light-emitting and super-luminescent diodes, and distributed Bragg reflectors (DBRs). Typically, n shows a variability depending on deposition conditions, which motivates the need for routine characterization of as-produced structures. While several measurement methods for n exist, among them (spectroscopic) ellipsometry and Fourier-transform infrared (FTIR) refractometry, they all come with their (dis-)advantages, e.g., accurate goniometric measurements or high-resolution FTIR [1].

Originalsprache	Englisch
Titel	2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
Herausgeber (Verlag)	IEEE
ISBN (elektronisch)	9798350345995
DOIs	https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10232458
Publikationsstatus	Veröffentlicht - 26 Juni 2023
Veranstaltung	2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023) - International Congress Centre Munich (Munich ICM), Munich, Deutschland Dauer: 26 Juni 2023 → 30 Juni 2023 https://www.cleoeurope.org/

Konferenz

Konferenz	2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023)
Kurztitel	CLEO/Europe-EQEC 2023
Land/Gebiet	Deutschland
Ort	Munich
Zeitraum	26/06/23 → 30/06/23
Internetadresse	https://www.cleoeurope.org/

ÖFOS 2012

104026 Spektroskopie
103021 Optik
103018 Materialphysik
205019 Materialwissenschaften

Zugriff auf Dokument

10.1109/CLEO/Europe-EQEC57999.2023.10232458

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

1 Abgeschlossen

CDL Mid-IR: CD-Labor für Mid-IR Spektroskopie und Halbleiter Optik
Heckl, O. H. & Simon, Y.
1/01/17 → 29/02/24
Projekt: Forschungskooperation

1 Teilnahme an ...
1 Vortrag
1 Forschung

High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures
Lukas W. Perner (Vortragende*r), Gar-Wing Truong (Autor*in), David Follman (Autor*in), Maximilian Prinz (Autor*in), Georg Winkler (Autor*in), Stephan Puchegger (Autor*in), Garrett D. Cole (Autor*in) & Oliver H. Heckl (Autor*in)
29 Juni 2023
Aktivität: Vorträge › Vortrag › Science to Science
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023)
Lukas Perner (Teilnehmer*in), Oliver H. Heckl (Teilnehmer*in), Maximilian Prinz (Teilnehmer*in) & Ulrich Galander (Teilnehmer*in)
26 Juni 2023 → 30 Juni 2023
Aktivität: Wissenschaftliche Veranstaltungen › Teilnahme an ...
Université de Neuchâtel
Lukas Perner (Gastforscher*in)
6 März 2023 → 11 März 2023
Aktivität: Gastaufenthalt (outgoing) › Forschung

5 Beitrag in Konferenzband
3 Artikel
2 Sonstiger Konferenzbeitrag
1 Patentschrift

High-Accuracy Measurement of Mid-IR Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures
Perner, L. W., Truong, G-W., Follman, D., Prinz, M., Winkler, G., Puchegger, S., Cole, G. D. & Heckl, O. H., 2023, CLEO 2023, Technical Digest Series. Optica Publishing Group, 2 S. SM4H.4
Veröffentlichungen: Beitrag in Buch › Beitrag in Konferenzband › Peer Reviewed
High-Precision Measurement of Birefringent Mode Splitting in an Ultrastable High-Finesse Optical Cavity with Crystalline Mirrors
Prinz, M., Perner, L. W., Heckl, O. H., Truong, G-W., Cole, G. D., Bober, M., Charczun, D., Morzyński, P., Narożnik, M. & Masłowski, P., 26 Juni 2023, 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). IEEE, 1 S. CE-3.2
Veröffentlichungen: Beitrag in Buch › Beitrag in Konferenzband › Peer Reviewed
Mid-Infrared Crystalline Supermirrors for Optical Cavities with 231 000 Finesse
Truong, G-W., Perner, L. W., Winkler, G., Cataño-Lopez, S. B., Nguyen, C., Follman, D., Heckl, O. H. & Cole, G. D., 2023, CLEO 2023. Optica Publishing Group, 2 S. STh1H.2. (OSA Technical Digest Series).
Veröffentlichungen: Beitrag in Buch › Beitrag in Konferenzband › Peer Reviewed

Zitationsweisen

Perner, L. W., Truong, G.-W., Follman, D., Prinz, M., Winkler, G., Puchegger, S., Cole, G. D., & Heckl, O. H. (2023). High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures. in 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC) IEEE. https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10232458

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title = "High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures",

abstract = "Accurate knowledge of the refractive index, n, of optical materials is required for the development of many optical devices in the visible (VIS), near- (NIR) and mid-infrared (MIR) spectral regions, such as lasers, light-emitting and super-luminescent diodes, and distributed Bragg reflectors (DBRs). Typically, n shows a variability depending on deposition conditions, which motivates the need for routine characterization of as-produced structures. While several measurement methods for n exist, among them (spectroscopic) ellipsometry and Fourier-transform infrared (FTIR) refractometry, they all come with their (dis-)advantages, e.g., accurate goniometric measurements or high-resolution FTIR [1].",

author = "Perner, {Lukas W.} and Gar-Wing Truong and David Follman and Maximilian Prinz and Georg Winkler and Stephan Puchegger and Cole, {Garrett D.} and Heckl, {Oliver H.}",

year = "2023",

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doi = "10.1109/CLEO/Europe-EQEC57999.2023.10232458",

language = "English",

booktitle = "2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)",

publisher = "IEEE",

note = "2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023), CLEO/Europe-EQEC 2023 ; Conference date: 26-06-2023 Through 30-06-2023",

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Perner, LW, Truong, G-W, Follman, D, Prinz, M, Winkler, G, Puchegger, S, Cole, GD & Heckl, OH 2023, High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures. in 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). IEEE, 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023), Munich, Deutschland, 26/06/23. https://doi.org/10.1109/CLEO/Europe-EQEC57999.2023.10232458

High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures. / Perner, Lukas W. (Korresp. Autor*in); Truong, Gar-Wing; Follman, David et al.
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). IEEE, 2023.

Veröffentlichungen: Beitrag in Buch › Beitrag in Konferenzband › Peer Reviewed

TY - GEN

T1 - High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

AU - Perner, Lukas W.

AU - Truong, Gar-Wing

AU - Follman, David

AU - Prinz, Maximilian

AU - Winkler, Georg

AU - Puchegger, Stephan

AU - Cole, Garrett D.

AU - Heckl, Oliver H.

PY - 2023/6/26

Y1 - 2023/6/26

N2 - Accurate knowledge of the refractive index, n, of optical materials is required for the development of many optical devices in the visible (VIS), near- (NIR) and mid-infrared (MIR) spectral regions, such as lasers, light-emitting and super-luminescent diodes, and distributed Bragg reflectors (DBRs). Typically, n shows a variability depending on deposition conditions, which motivates the need for routine characterization of as-produced structures. While several measurement methods for n exist, among them (spectroscopic) ellipsometry and Fourier-transform infrared (FTIR) refractometry, they all come with their (dis-)advantages, e.g., accurate goniometric measurements or high-resolution FTIR [1].

AB - Accurate knowledge of the refractive index, n, of optical materials is required for the development of many optical devices in the visible (VIS), near- (NIR) and mid-infrared (MIR) spectral regions, such as lasers, light-emitting and super-luminescent diodes, and distributed Bragg reflectors (DBRs). Typically, n shows a variability depending on deposition conditions, which motivates the need for routine characterization of as-produced structures. While several measurement methods for n exist, among them (spectroscopic) ellipsometry and Fourier-transform infrared (FTIR) refractometry, they all come with their (dis-)advantages, e.g., accurate goniometric measurements or high-resolution FTIR [1].

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DO - 10.1109/CLEO/Europe-EQEC57999.2023.10232458

M3 - Contribution to proceedings

BT - 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)

PB - IEEE

T2 - 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023)

Y2 - 26 June 2023 through 30 June 2023

ER -

High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

Abstract

Konferenz

ÖFOS 2012

Zugriff auf Dokument

Andere Dateien und Links

Fingerprint

Projekte

CDL Mid-IR: CD-Labor für Mid-IR Spektroskopie und Halbleiter Optik

Aktivitäten

High-Accuracy Measurement of Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023)

Université de Neuchâtel

Publikationen

High-Accuracy Measurement of Mid-IR Refractive Indices in GaAs/AlGaAs Thin-Film Heterostructures

High-Precision Measurement of Birefringent Mode Splitting in an Ultrastable High-Finesse Optical Cavity with Crystalline Mirrors

Mid-Infrared Crystalline Supermirrors for Optical Cavities with 231 000 Finesse

Zitationsweisen