Microstructure of post-deformed ECAP-Ti investigated by multiple X-ray line profile analysis

Erhard Schafler, K Nyilas, Sigrid Bernstorff, L Zeipper, Michael Zehetbauer, Tamas Ungar

    Veröffentlichungen: Beitrag in FachzeitschriftArtikelPeer Reviewed

    Abstract

    99.5% pure a-Ti was deformed by equal channel angular pressing (ECAP) at 450°C for 8 passes in route BC. Samples which were manufactured out of the bulk have been deformed by compression up to 80% true strain and analysed by Multi reflection X-ray Line Profile Analysis (MXPA). It turned out that from the 11 slip systems possible in hexagonal Ti only those with Burgers vector b1 = 1/3 <110> ( type) and b3 = 1/3 <113> ( type) have been activated during compression. After the ECAP deformation area weighted mean of the coherently scattering domain size has a relatively small value of about 40 nm. During the additional compression it stays fairly constant, whereas the size distribution function broadens slightly. After the ECAP process the dislocation density is considerably high at 2×1015 m-2 and increases up to 5 times with growing post-deformation. Œ by Oldenbourg Wissenschaftsverlag.
    OriginalspracheEnglisch
    Seiten (von - bis)129-134
    Seitenumfang6
    FachzeitschriftZeitschrift für Kristallographie : international journal for structural, physical, and chemical aspects of crystalline materials
    Jahrgang221
    AusgabenummerSUPPL. 23
    PublikationsstatusVeröffentlicht - 2006

    ÖFOS 2012

    • 1030 Physik, Astronomie

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