Nanostructures in bulk metals and alloys studied by TEM

Hans-Peter Karnthaler; Bernhard Mingler; Christian Rentenberger; Thomas Waitz

doi:10.1017/S143192760302614X

Nanostructures in bulk metals and alloys studied by TEM

Hans-Peter Karnthaler, Bernhard Mingler, Christian Rentenberger, Thomas Waitz

Veröffentlichungen: Beitrag in Fachzeitschrift › Meeting Abstract/Conference Paper

Originalsprache	Englisch
Seiten (von - bis)	336-337
Seitenumfang	2
Fachzeitschrift	Microscopy and Microanalysis
Jahrgang	9
Ausgabenummer	Suppl. 03
DOIs	https://doi.org/10.1017/S143192760302614X
Publikationsstatus	Veröffentlicht - 2003

ÖFOS 2012

1030 Physik, Astronomie

Zugriff auf Dokument

10.1017/S143192760302614X

http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=174399&fulltextType=&fileId=

Zitationsweisen

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title = "Nanostructures in bulk metals and alloys studied by TEM",

author = "Hans-Peter Karnthaler and Bernhard Mingler and Christian Rentenberger and Thomas Waitz",

note = "Coden: MIMIF Affiliations: Institute of Materials Physics, University of Vienna, Boltzmanngasse 5, A-1090 Vienna, Austria Adressen: Karnthaler, H.P.; Institute of Materials Physics; University of Vienna; Boltzmanngasse 5 A-1090 Vienna, Austria Import aus Scopus: 2-s2.0-0142122971 04.12.2007: Datenanforderung 2001 (Import Sachbearbeiter)",

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T1 - Nanostructures in bulk metals and alloys studied by TEM

AU - Karnthaler, Hans-Peter

AU - Mingler, Bernhard

AU - Rentenberger, Christian

AU - Waitz, Thomas

N1 - Coden: MIMIF Affiliations: Institute of Materials Physics, University of Vienna, Boltzmanngasse 5, A-1090 Vienna, Austria Adressen: Karnthaler, H.P.; Institute of Materials Physics; University of Vienna; Boltzmanngasse 5 A-1090 Vienna, Austria Import aus Scopus: 2-s2.0-0142122971 04.12.2007: Datenanforderung 2001 (Import Sachbearbeiter)

PY - 2003

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U2 - 10.1017/S143192760302614X

DO - 10.1017/S143192760302614X

M3 - Meeting abstract/Conference paper

SN - 1431-9276

VL - 9

SP - 336

EP - 337

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl. 03

ER -