Oxygen-deficient line defects in an ultrathin aluminum oxide film

Michael A. Schmid, M Shishkin, Georg Kresse, E Napetschnig, Peter Varga, M Kulawik, Niklas Nilius, Hans Peter Rust, H -J Freund

    Veröffentlichungen: Beitrag in FachzeitschriftArtikelPeer Reviewed

    Abstract

    A model for the straight antiphase domain boundary of the ultrathin aluminum oxide film on the NiAl(110) substrate is derived from scanning tunneling microscopy measurements and density-functional theory calculations. Although the local bonding environment of the perfect film is maintained, the structure is oxygen deficient and possesses a favorable adsorption site. The domain boundary exhibits a downwards band bending and three characteristic unoccupied electronic states, in excellent agreement with scanning tunneling spectroscopy measurements. Œ 2006 The American Physical Society.
    OriginalspracheEnglisch
    Aufsatznummer046101
    Seitenumfang4
    FachzeitschriftPhysical Review Letters
    Jahrgang97
    Ausgabenummer4
    DOIs
    PublikationsstatusVeröffentlicht - 2006

    ÖFOS 2012

    • 103018 Materialphysik

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