Structural methods for studying nanocrystalline materials

Roland Grössinger, Gerald Badurek, J Fidler, Michael Zehetbauer, Charles D. Dewhurst

    Veröffentlichungen: Beitrag in BuchBeitrag in Konferenzband

    Abstract

    The most important methods for determining the grain size, the grain size distribution and also the actual microstructure of nanocrystalline materials are: X-ray diffraction line profile analysis, transmission electron microscopy, and small-angle neutron scattering. For each of these three methods their specific advantages and disadvantages are discussed and an experimental example is given. Π2005 Elsevier B.V. All rights reserved.
    OriginalspracheEnglisch
    TitelNANO2004
    Untertitel3rd Integrated Nanosystems Conference : design, synthesis, and applications : September 22-24, 2004, Pasadena, California, USA
    ErscheinungsortNew York
    Herausgeber (Verlag)Elsevier BV, North-Holland
    Seiten152-158
    Seitenumfang7
    ISBN (Print)9780791837498
    DOIs
    PublikationsstatusVeröffentlicht - 2005

    Publikationsreihe

    ReiheJournal of Magnetism and Magnetic Materials
    Nummer2
    Band294
    ISSN0304-8853

    ÖFOS 2012

    • 1030 Physik, Astronomie

    Zitationsweisen