TEM investigation of the structure of deformation-induced antiphase boundary faults in Ni3Al

Christian Rentenberger, Thomas Waitz, Hans-Peter Karnthaler

    Veröffentlichungen: Beitrag in FachzeitschriftArtikelPeer Reviewed

    Abstract

    Transmission electron microscopy (TEM) methods were used to analyze the deformation-induced antiphase boundary (APB) tubes in a Ni3Al single crystal. A high density of tubes is observed after room-temperature deformation showing strong contrasts in some fundamental reflections. This is not expected from a hard sphere model of the APB faults bounding the tubes since in this case the APB faults are just chemical faults (displacement vector RC→=1/2⟨110⟩). The TEM analysis shows unambiguously that the APB faults contain a small additional structural displacement vector RS→. RS→ lies in the plane of the fault and is perpendicular to RC→.
    OriginalspracheEnglisch
    Aufsatznummer094109
    Seitenumfang5
    FachzeitschriftPhysical Review B
    Jahrgang67
    Ausgabenummer9
    DOIs
    PublikationsstatusVeröffentlicht - 2003

    ÖFOS 2012

    • 1030 Physik, Astronomie

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