Focused-ion-beam nano-machining: A tool for high-precision sample preparation for ion irradiation

  • Chutimun Chanmuang Nasdala (Speaker)
  • Habler, G. (Contributor)
  • Christoph Lenz (Contributor)
  • Nasdala, L. (Contributor)

Activity: Talks and presentationsTalk or oral contributionScience to Science

Period26 Feb 2020
Event title37th International Conference of the Microscopy Society of Thailand
Event typeConference
LocationNakhon Ratchasima, ThailandShow on map
Degree of RecognitionInternational