In-situ Synchrotron Multi-Reflection X-ray Line Profile Analysis of Semicrystalline Polymers
- Florian Spieckermann (Contributor)
- Gerald Polt (Contributor)
- Harald Wilhelm (Contributor)
- Sigrid Bernstorff (Contributor)
- Schafler, E. (Contributor)
- Zehetbauer, M. (Contributor)
Activity: Talks and presentations › Poster presentation › Science to Science