| Period | 27 Jun 2023 → 30 Jun 2023 |
|---|---|
| Event type | Exhibition |
| Location | München, Germany, BavariaShow on map |
| Degree of Recognition | International |
Related content
-
Activities
-
High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers
Activity: Talks and presentations › Poster presentation › Science to Science
-
Progress towards a 100 000 finesse optical cavity in the mid-infrared
Activity: Talks and presentations › Poster presentation › Science to Science
-
2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC 2023)
Activity: Academic events › Participation in ...
-
Crystalline Supermirrors for Infrared Applications
Activity: Talks and presentations › Talk or oral contribution › Science to Science
-
FLAIR 2022 - Field Laser Applications in Industry and Research 2022
Activity: Academic events › Participation in ...
-
Projects
-
Christian Doppler Laboratory for Mid-IR Spectroscopy and Semiconductor Optics
Project: Research cooperation
-
Publications
-
High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers
Publications: Contribution to conference › Other contribution to conference › Peer Reviewed
-
Progress towards a 100 000 finesse optical cavity in the mid-infrared
Publications: Contribution to conference › Other contribution to conference › Peer Reviewed
-
Progress Towards a > 100,000 Finesse Optical Cavity at 4.5 µm
Publications: Contribution to book › Contribution to proceedings › Peer Reviewed
-
Mid-infrared interference coatings with excess optical loss below 10 ppm
Publications: Contribution to journal › Article › Peer Reviewed
-
Substrate-transferred stacked optical coatings
Publications: Patent
-
High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers
Publications: Contribution to book › Contribution to proceedings › Peer Reviewed
-
Simultaneous measurement of mid-infrared refractive indices in thin-film heterostructures: Methodology and results for GaAs/AlGaAs
Publications: Contribution to journal › Article › Peer Reviewed