TY - JOUR
T1 - A photoelectron diffraction study of the surface-V2O3 (2 × 2) layer on Pd(1 1 1)
AU - Sambi, M
AU - Petukhov, M
AU - Domenichini, B
AU - Rizzi, G A
AU - Surnev, Svetlozar L.
AU - Kresse, Georg
AU - Netzer, Falko P.
AU - Granozzi, G
N1 - Zeitschrift: Surface Science
DOI: 10.1016/S0039-6028(03)00070-0
Coden: SUSCA
Affiliations: Unità di Ricerca, INFM, Università di Padova, Via Loredan 4, 35131 Padova, Italy; Institut für Experimentalphysik, Karl-Franzens-Universität Graz, A-8010 Graz, Austria; Institut für Materialphysik, Universität Wien, Sensengasse 8/12, A-1090 Wien, Austria; IGNP, Russian Research Center, Kurchatov Institute, Kurchatov sq., 123182 Moscow, Russian Federation; Lab. Rech. la Reactivite des Solides, Université de Bourgogne, 21078 Dijon, France
Adressen: Sambi, M.; Unità di Ricerca; INFM; Università di Padova; Via Loredan 4 35131 Padova, Italy; email: [email protected]
Import aus Scopus: 2-s2.0-0037376026
22.10.2007: Datenanforderung 1935 (Import Sachbearbeiter)
22.10.2007: Datenanforderung 1936 (Import Sachbearbeiter)
PY - 2003
Y1 - 2003
N2 - X-ray photoelectron diffraction (XPD) has been applied to the study of the surface-(s)-V2O3 (2 × 2) layer on Pd(1 1 1), which is a novel interface-stabilised vanadium oxide phase with no bulk oxide counterpart. It has been detected by scanning tunnelling microscopy (STM) during the growth of ultrathin films of vanadium oxide on Pd(1 1 1). XPD confirms the general features of the model for s-V2O3/Pd(1 1 1), which has been proposed previously on the basis of STM measurements and ab initio density-functional-theory (DFT) calculations. In addition, quantitative agreement is found between the DFT model and the XPD experiment in the estimate of the average V-O interlayer spacing: the experimental result is 0.72 ‘ 0.07 Å, while the DFT-derived value is 0.723 Å. Œ 2003 Elsevier Science B.V. All rights reserved.
AB - X-ray photoelectron diffraction (XPD) has been applied to the study of the surface-(s)-V2O3 (2 × 2) layer on Pd(1 1 1), which is a novel interface-stabilised vanadium oxide phase with no bulk oxide counterpart. It has been detected by scanning tunnelling microscopy (STM) during the growth of ultrathin films of vanadium oxide on Pd(1 1 1). XPD confirms the general features of the model for s-V2O3/Pd(1 1 1), which has been proposed previously on the basis of STM measurements and ab initio density-functional-theory (DFT) calculations. In addition, quantitative agreement is found between the DFT model and the XPD experiment in the estimate of the average V-O interlayer spacing: the experimental result is 0.72 ‘ 0.07 Å, while the DFT-derived value is 0.723 Å. Œ 2003 Elsevier Science B.V. All rights reserved.
U2 - 10.1016/S0039-6028(03)00070-0
DO - 10.1016/S0039-6028(03)00070-0
M3 - Article
SN - 0039-6028
VL - 529
SP - 234
EP - 238
JO - Surface Science
JF - Surface Science
IS - 1-2
ER -