TY - JOUR
T1 - Advances in microstructural investigation using the REM-ECC-imaging technique
AU - Stickler, C
AU - Melisova, Dana
AU - Mingler, Bernhard
AU - Weiss, Brigitte
AU - Stickler, Roland
N1 - Affiliations: Inst. Phys. Chem. - W., Universitat Wein, Währingerstr. 42, A-1090 Wien, Germany; Miba Sintermetall AG, A-4655 Vorchdorf, Germany
Adressen: Stickler, C.; Miba Sintermetall AG Vorchdorf, Germany
Source-File: PhysChemieScopus.csv
Import aus Scopus: 2-s2.0-0035124803
Importdatum: 21.12.2006 12:14:07
04.12.2007: Datenanforderung 2001 (Import Sachbearbeiter)
PY - 2001
Y1 - 2001
N2 - With the improvements made in Scanning Electron Microscopy (SEM) it is now possible, using the Electron-Channelling-Contrast-Imaging (ECCI) technique, to image the global arrangement of dislocations in metallic materials. This type of investigation is complementary to imaging by diffraction contrast in the Transmission Electron Microscope (TEM) and in comparison requires less specimen preparation. Using the ECCI-technique, it is possible to examine almost the whole of the electro-polished surface of a solid specimen of magnifications of up to 10,000 times. In addition, using Selected-Area-Channelling-Diagrams (SACP), the orientation of areas of the specimen less than 30 œm in diameter can be determined. In doing this, there is no requirement to tilt the specimen, the orientation being related directly to the ECC-image. Following a short description of the SEM-ECC imaging process, its possible uses are illustrated with reference to actual practical examples.
AB - With the improvements made in Scanning Electron Microscopy (SEM) it is now possible, using the Electron-Channelling-Contrast-Imaging (ECCI) technique, to image the global arrangement of dislocations in metallic materials. This type of investigation is complementary to imaging by diffraction contrast in the Transmission Electron Microscope (TEM) and in comparison requires less specimen preparation. Using the ECCI-technique, it is possible to examine almost the whole of the electro-polished surface of a solid specimen of magnifications of up to 10,000 times. In addition, using Selected-Area-Channelling-Diagrams (SACP), the orientation of areas of the specimen less than 30 œm in diameter can be determined. In doing this, there is no requirement to tilt the specimen, the orientation being related directly to the ECC-image. Following a short description of the SEM-ECC imaging process, its possible uses are illustrated with reference to actual practical examples.
M3 - Article
SN - 0032-678X
VL - 38
SP - 19
EP - 30
JO - Praktische Metallographie = Practical metallography
JF - Praktische Metallographie = Practical metallography
IS - 1
ER -