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An improved FIB sample preparation technique for site-specific plan-view specimens: A new cutting geometry

Publications: Contribution to journal › Article › Peer Reviewed

Original languageEnglish
Pages (from-to)310-317
Number of pages8
JournalUltramicroscopy
Volume184
Issue number310-317
DOIs
Publication statusPublished - Jan 2018

Funding

This research was funded by the European Union's Horizon 2020 research and innovation programme under the Marie Sklodowska-Curie grants No. 656378 - Interfacial Reactions (CL), and the Austrian Science Fund FWF: I1704-N19 in the framework of the research group FOR741-DACH (GH). The FEI Quanta 3D FEG-SEM instrument is supported by the Faculty of Geosciences, Geography and Astronomy at the University of Vienna, Austria. CL would like to acknowledge Prof. Jorgen Weis and Dr. Bernhard Fenk from Max Planck Institute for Solid State Research and the two anonymous reviewers for their helpful comments.

Austrian Fields of Science 2012

  • 104012 Microanalysis
  • 105120 Petrology

Keywords

  • FOCUSED ION-BEAM
  • LIFT-OUT TECHNIQUE
  • TEM
  • SYSTEM

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