Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Christian Kramberger; Andreas Mittelberger; Christoph Hofer; Jannik C. Meyer

doi:10.1002/pssb.201700176

Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Christian Kramberger (Corresponding author), Andreas Mittelberger, Christoph Hofer, Jannik C. Meyer

Physics of Nanostructured Materials

Publications: Contribution to journal › Article › Peer Reviewed

Original language	English
Article number	1700176
Number of pages	6
Journal	Physica Status Solidi. B: Basic Research
Volume	254
Issue number	11
DOIs	https://doi.org/10.1002/pssb.201700176
Publication status	Published - Nov 2017

Austrian Fields of Science 2012

103042 Electron microscopy
103018 Materials physics

Keywords

graphene
point defects
scanning transmission electron microscopy
ATOMIC-RESOLUTION
RADIATION-DAMAGE
EXPOSURES

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10.1002/pssb.201700176

Cite this

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title = "Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction",

keywords = "graphene, point defects, scanning transmission electron microscopy, ATOMIC-RESOLUTION, RADIATION-DAMAGE, EXPOSURES",

author = "Christian Kramberger and Andreas Mittelberger and Christoph Hofer and Meyer, {Jannik C.}",

note = "Publisher Copyright: {\textcopyright} 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim",

year = "2017",

month = nov,

doi = "10.1002/pssb.201700176",

language = "English",

volume = "254",

journal = "Physica Status Solidi. B: Basic Research",

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Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction. / Kramberger, Christian (Corresponding author); Mittelberger, Andreas; Hofer, Christoph et al.

In: Physica Status Solidi. B: Basic Research, Vol. 254, No. 11, 1700176, 11.2017.

Publications: Contribution to journal › Article › Peer Reviewed

TY - JOUR

T1 - Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

AU - Kramberger, Christian

AU - Mittelberger, Andreas

AU - Hofer, Christoph

AU - Meyer, Jannik C.

PY - 2017/11

Y1 - 2017/11

KW - graphene

KW - point defects

KW - scanning transmission electron microscopy

KW - ATOMIC-RESOLUTION

KW - RADIATION-DAMAGE

KW - EXPOSURES

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U2 - 10.1002/pssb.201700176

DO - 10.1002/pssb.201700176

M3 - Article

VL - 254

JO - Physica Status Solidi. B: Basic Research

JF - Physica Status Solidi. B: Basic Research

SN - 0370-1972

IS - 11

M1 - 1700176

ER -

Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Austrian Fields of Science 2012

Keywords

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PICOMAT: Picometer scale insight and manipulation of novel materials

Cite this

Analysis of Point Defects in Graphene Using Low Dose Scanning Transmission Electron Microscopy Imaging and Maximum Likelihood Reconstruction

Austrian Fields of Science 2012

Keywords

Access to Document

Other files and links

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PICOMAT: Picometer scale insight and manipulation of novel materials

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