@inproceedings{90519ef9915642f4957c663bee21ab73,
title = "Combining TEM diffraction and imaging for a complete structural analysis of bulk nanocrystalline materials using example of FeAl",
author = "Christoph Gammer and Clemens Mangler and Hans-Peter Karnthaler and Christian Rentenberger",
note = "Publication start page : 535 Host publication data : Proceedings of the Microscopy Conference Kiel, DGE ISBN 978-3-00-033910-3",
year = "2011",
language = "English",
isbn = "978-3-00-033910-3",
booktitle = "Proceedings of the Microscopy Conference Kiel, DGE",
publisher = "Unknown publisher",
}