Correlated AFM/STEM Study on the Mechanical Stiffness of Defect-Engineered Graphene

Wael Joudi (Corresponding author), Alberto Trentino, Kimmo Mustonen, Clemens Mangler, Jani Kotakoski

Publications: Contribution to journalMeeting abstract/Conference paper

Original languageEnglish
Pages (from-to)2626-2628
Number of pages3
JournalMicroscopy and Microanalysis
Volume28
Issue numberS1
Early online date22 Jul 2022
DOIs
Publication statusPublished - Aug 2022

Austrian Fields of Science 2012

  • 103008 Experimental physics
  • 103009 Solid state physics
  • 103018 Materials physics
  • 103042 Electron microscopy

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