Crystal structures, site occupations and phase equilibria in the system V-Zr-Ge

Martin Marker; Herta Silvia Effenberger; Klaus Richter

doi:10.1016/j.solidstatesciences.2009.05.005

Crystal structures, site occupations and phase equilibria in the system V-Zr-Ge

Martin Marker, Herta Silvia Effenberger, Klaus Richter (Corresponding author)

Publications: Contribution to journal › Article › Peer Reviewed

Abstract

The V-Zr-Ge system was studied for two isothermal sections at 900 and 1200 °C. Three ternary compounds VZrGe (tI12, I4/mmm, CeScSi-type), VxZr5-xGe4 (oP36, Pnma, Sm5Ge4-type) and V4+xZr2-xGe5 (oI44, Ibam, Si5V6-type) were structurally characterized. Optical microscopy and powder X-ray diffraction (XRD) were used for initial sample characterization and electron probe microanalysis (EPMA) of the annealed samples was used to determine the exact phase compositions. The variation of the cell parameters of the various ternary solid solutions with the composition was determined. The three ternary phases were structurally characterized by means of single crystal and powder XRD. While VZrGe is almost a line compound, VxZr5-xGe4 (0.2 ? x ? 3.0) and V4+xZr2-xGe5 (0.06 ? x ? 1.2) are forming extended solid solution ranges stabilized by differential fractional site occupancy of V and Zr on the metal sites.

Original language	English
Pages (from-to)	1475-1483
Number of pages	9
Journal	Solid State Sciences
Volume	11
Issue number	8
DOIs	https://doi.org/10.1016/j.solidstatesciences.2009.05.005
Publication status	Published - 2009

Austrian Fields of Science 2012

104003 Inorganic chemistry
105113 Crystallography
104011 Materials chemistry

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10.1016/j.solidstatesciences.2009.05.005

Cite this

@article{450c7349c3ad4c558e087b4e23e93f05,

title = "Crystal structures, site occupations and phase equilibria in the system V-Zr-Ge",

abstract = "The V-Zr-Ge system was studied for two isothermal sections at 900 and 1200 °C. Three ternary compounds VZrGe (tI12, I4/mmm, CeScSi-type), VxZr5-xGe4 (oP36, Pnma, Sm5Ge4-type) and V4+xZr2-xGe5 (oI44, Ibam, Si5V6-type) were structurally characterized. Optical microscopy and powder X-ray diffraction (XRD) were used for initial sample characterization and electron probe microanalysis (EPMA) of the annealed samples was used to determine the exact phase compositions. The variation of the cell parameters of the various ternary solid solutions with the composition was determined. The three ternary phases were structurally characterized by means of single crystal and powder XRD. While VZrGe is almost a line compound, VxZr5-xGe4 (0.2 ? x ? 3.0) and V4+xZr2-xGe5 (0.06 ? x ? 1.2) are forming extended solid solution ranges stabilized by differential fractional site occupancy of V and Zr on the metal sites.",

author = "Martin Marker and Effenberger, {Herta Silvia} and Klaus Richter",

note = "Marker, M.C.J.a , Effenberger, H.S.b , Richter, K.W.a a Department of Inorganic Chemistry/Materials Chemistry, University of Vienna, W{\"a}hringerstra{\ss}e 42, 1090 Wien, Austria b Institut f{\"u}r Mineralogie und Kristallographie, Universit{\"a}t Wien, Althanstrasse 14, A-1090 Wien, Austria",

year = "2009",

doi = "10.1016/j.solidstatesciences.2009.05.005",

language = "English",

volume = "11",

pages = "1475--1483",

journal = "Solid State Sciences",

issn = "1293-2558",

publisher = "ELSEVIER SCIENCE BV",

number = "8",

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TY - JOUR

T1 - Crystal structures, site occupations and phase equilibria in the system V-Zr-Ge

AU - Marker, Martin

AU - Effenberger, Herta Silvia

AU - Richter, Klaus

N1 - Marker, M.C.J.a , Effenberger, H.S.b , Richter, K.W.a a Department of Inorganic Chemistry/Materials Chemistry, University of Vienna, Währingerstraße 42, 1090 Wien, Austria b Institut für Mineralogie und Kristallographie, Universität Wien, Althanstrasse 14, A-1090 Wien, Austria

PY - 2009

Y1 - 2009

N2 - The V-Zr-Ge system was studied for two isothermal sections at 900 and 1200 °C. Three ternary compounds VZrGe (tI12, I4/mmm, CeScSi-type), VxZr5-xGe4 (oP36, Pnma, Sm5Ge4-type) and V4+xZr2-xGe5 (oI44, Ibam, Si5V6-type) were structurally characterized. Optical microscopy and powder X-ray diffraction (XRD) were used for initial sample characterization and electron probe microanalysis (EPMA) of the annealed samples was used to determine the exact phase compositions. The variation of the cell parameters of the various ternary solid solutions with the composition was determined. The three ternary phases were structurally characterized by means of single crystal and powder XRD. While VZrGe is almost a line compound, VxZr5-xGe4 (0.2 ? x ? 3.0) and V4+xZr2-xGe5 (0.06 ? x ? 1.2) are forming extended solid solution ranges stabilized by differential fractional site occupancy of V and Zr on the metal sites.

AB - The V-Zr-Ge system was studied for two isothermal sections at 900 and 1200 °C. Three ternary compounds VZrGe (tI12, I4/mmm, CeScSi-type), VxZr5-xGe4 (oP36, Pnma, Sm5Ge4-type) and V4+xZr2-xGe5 (oI44, Ibam, Si5V6-type) were structurally characterized. Optical microscopy and powder X-ray diffraction (XRD) were used for initial sample characterization and electron probe microanalysis (EPMA) of the annealed samples was used to determine the exact phase compositions. The variation of the cell parameters of the various ternary solid solutions with the composition was determined. The three ternary phases were structurally characterized by means of single crystal and powder XRD. While VZrGe is almost a line compound, VxZr5-xGe4 (0.2 ? x ? 3.0) and V4+xZr2-xGe5 (0.06 ? x ? 1.2) are forming extended solid solution ranges stabilized by differential fractional site occupancy of V and Zr on the metal sites.

U2 - 10.1016/j.solidstatesciences.2009.05.005

DO - 10.1016/j.solidstatesciences.2009.05.005

M3 - Article

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JO - Solid State Sciences

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