Electron back scatter diffraction and synchrotron x-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals

T Hebesberger; Erhard Schafler; Michael Zehetbauer; Reinhard Pippan; Tamas Ungar; Sigrid Bernstorff

Electron back scatter diffraction and synchrotron x-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals

T Hebesberger, Erhard Schafler, Michael Zehetbauer, Reinhard Pippan, Tamas Ungar, Sigrid Bernstorff

Publications: Contribution to journal › Article › Peer Reviewed

Original language	English
Pages (from-to)	410-416
Number of pages	7
Journal	International Journal of Materials Research
Volume	92
Issue number	5
Publication status	Published - 2001

Austrian Fields of Science 2012

1030 Physics, Astronomy

Cite this

@article{05e36806364f48a1a52f0ee243402b6f,

title = "Electron back scatter diffraction and synchrotron x-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals",

author = "T Hebesberger and Erhard Schafler and Michael Zehetbauer and Reinhard Pippan and Tamas Ungar and Sigrid Bernstorff",

note = "Zeitschrift: Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques Coden: ZEMTA Affiliations: Institut f{\"u}r Materialphysik, Universit{\"a}t Wien, Strudlhofgasse 4, A-1090 Wien, Austria Adressen: Zehetbauer, M.; Institut f{\"u}r Materialphysik; Universit{\"a}t Wien; Strudlhofgasse 4 A-1090 Wien, Austria; email: [email protected] Import aus Scopus: 2-s2.0-0035325539 04.12.2007: Datenanforderung 2001 (Import Sachbearbeiter)",

year = "2001",

language = "English",

volume = "92",

pages = "410--416",

journal = "International Journal of Materials Research",

issn = "1862-5282",

publisher = "CARL HANSER VERLAG",

number = "5",

}

Electron back scatter diffraction and synchrotron x-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals. / Hebesberger, T; Schafler, Erhard; Zehetbauer, Michael et al.
In: International Journal of Materials Research, Vol. 92, No. 5, 2001, p. 410-416.

Publications: Contribution to journal › Article › Peer Reviewed

TY - JOUR

T1 - Electron back scatter diffraction and synchrotron x-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals

AU - Hebesberger, T

AU - Schafler, Erhard

AU - Zehetbauer, Michael

AU - Pippan, Reinhard

AU - Ungar, Tamas

AU - Bernstorff, Sigrid

N1 - Zeitschrift: Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques Coden: ZEMTA Affiliations: Institut für Materialphysik, Universität Wien, Strudlhofgasse 4, A-1090 Wien, Austria Adressen: Zehetbauer, M.; Institut für Materialphysik; Universität Wien; Strudlhofgasse 4 A-1090 Wien, Austria; email: [email protected] Import aus Scopus: 2-s2.0-0035325539 04.12.2007: Datenanforderung 2001 (Import Sachbearbeiter)

PY - 2001

Y1 - 2001

M3 - Article

SN - 1862-5282

VL - 92

SP - 410

EP - 416

JO - International Journal of Materials Research

JF - International Journal of Materials Research

IS - 5

ER -

Electron back scatter diffraction and synchrotron x-ray peak profile analysis as tools for microstructural characterization of large strain work hardened metals

Austrian Fields of Science 2012

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