Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes

Toma Susi; Mukesh Tripathi; Kimmo Mustonen; Alexander Markevich; Clemens Mangler; Cong Su; Ju Li; Juan Carlos Idrobo; Jannik Meyer; Jani Kotakoski

doi:10.1017/S1431927619005427

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes

Toma Susi (Corresponding author), Mukesh Tripathi, Kimmo Mustonen, Alexander Markevich, Clemens Mangler, Cong Su, Ju Li, Juan Carlos Idrobo, Jannik Meyer, Jani Kotakoski

Physics of Nanostructured Materials

Publications: Contribution to journal › Meeting abstract/Conference paper › Peer Reviewed

Original language	English
Pages (from-to)	938-939
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	25
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927619005427
Publication status	Published - 1 Aug 2019
Event	Microscopy and Microanalysis - Oregon convention center, Portland, United States Duration: 4 Aug 2019 → 8 Aug 2019 Conference number: 2019 https://www.microscopy.org/MandM/2019/

Austrian Fields of Science 2012

103018 Materials physics
103009 Solid state physics
103042 Electron microscopy

Access to Document

10.1017/S1431927619005427

ATMEN: Atomic precision materials engineering
Susi, T. & Theussl, L.
1/10/17 → 30/09/22
Project: Research funding

Cite this

@article{834b9d55fdb74ec298deb9f78c21ff3e,

title = "Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes",

author = "Toma Susi and Mukesh Tripathi and Kimmo Mustonen and Alexander Markevich and Clemens Mangler and Cong Su and Ju Li and Idrobo, {Juan Carlos} and Jannik Meyer and Jani Kotakoski",

year = "2019",

month = aug,

day = "1",

doi = "10.1017/S1431927619005427",

language = "English",

volume = "25",

pages = "938--939",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "CAMBRIDGE UNIV PRESS",

number = "S2",

note = "Microscopy and Microanalysis, M and M ; Conference date: 04-08-2019 Through 08-08-2019",

url = "https://www.microscopy.org/MandM/2019/",

}

TY - JOUR

T1 - Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes

AU - Susi, Toma

AU - Tripathi, Mukesh

AU - Mustonen, Kimmo

AU - Markevich, Alexander

AU - Mangler, Clemens

AU - Su, Cong

AU - Li, Ju

AU - Idrobo, Juan Carlos

AU - Meyer, Jannik

AU - Kotakoski, Jani

N1 - Conference code: 2019

PY - 2019/8/1

Y1 - 2019/8/1

U2 - 10.1017/S1431927619005427

DO - 10.1017/S1431927619005427

M3 - Meeting abstract/Conference paper

SN - 1431-9276

VL - 25

SP - 938

EP - 939

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

T2 - Microscopy and Microanalysis

Y2 - 4 August 2019 through 8 August 2019

ER -

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes

Austrian Fields of Science 2012

Access to Document

Projects

ATMEN: Atomic precision materials engineering

Cite this