Electron-Beam Manipulation of Silicon Impurities in Single-Walled Carbon Nanotubes

Kimmo Mustonen; Alexander Markevich; Mukesh Tripathi; Heena Inani; Er Xiong Ding; Aqeel Hussain; Clemens Mangler; Esko I. Kauppinen; Jani Kotakoski; Toma Susi

doi:10.1002/adfm.201901327

Electron-Beam Manipulation of Silicon Impurities in Single-Walled Carbon Nanotubes

Kimmo Mustonen (Corresponding author), Alexander Markevich, Mukesh Tripathi, Heena Inani, Er Xiong Ding, Aqeel Hussain, Clemens Mangler, Esko I. Kauppinen, Jani Kotakoski, Toma Susi (Corresponding author)

Physics of Nanostructured Materials

Publications: Contribution to journal › Article › Peer Reviewed

Original language	English
Article number	1901327
Number of pages	7
Journal	Advanced Functional Materials
Volume	29
Issue number	52
Early online date	17 Jun 2019
DOIs	https://doi.org/10.1002/adfm.201901327
Publication status	Published - 27 Dec 2019

Austrian Fields of Science 2012

103042 Electron microscopy
210004 Nanomaterials
210006 Nanotechnology
102009 Computer simulation

Keywords

atom manipulation
heteroatoms
nanotechnology
STEM

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10.1002/adfm.201901327Licence: CC BY 4.0

https://phaidra.univie.ac.at/o:1093479Licence: CC BY 4.0

Cite this

@article{feee2e76c7b246a188c9f0a7851c8e9c,

title = "Electron-Beam Manipulation of Silicon Impurities in Single-Walled Carbon Nanotubes",

keywords = "atom manipulation, heteroatoms, nanotechnology, STEM",

author = "Kimmo Mustonen and Alexander Markevich and Mukesh Tripathi and Heena Inani and Ding, {Er Xiong} and Aqeel Hussain and Clemens Mangler and Kauppinen, {Esko I.} and Jani Kotakoski and Toma Susi",

note = "Publisher Copyright: {\textcopyright} 2019 The Authors. Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim",

year = "2019",

month = dec,

day = "27",

doi = "10.1002/adfm.201901327",

language = "English",

volume = "29",

journal = "Advanced Functional Materials",

issn = "1616-301X",

publisher = "WILEY-V C H VERLAG GMBH",

number = "52",

}

TY - JOUR

T1 - Electron-Beam Manipulation of Silicon Impurities in Single-Walled Carbon Nanotubes

AU - Mustonen, Kimmo

AU - Markevich, Alexander

AU - Tripathi, Mukesh

AU - Inani, Heena

AU - Ding, Er Xiong

AU - Hussain, Aqeel

AU - Mangler, Clemens

AU - Kauppinen, Esko I.

AU - Kotakoski, Jani

AU - Susi, Toma

PY - 2019/12/27

Y1 - 2019/12/27

KW - atom manipulation

KW - heteroatoms

KW - nanotechnology

KW - STEM

UR - http://www.scopus.com/inward/record.url?scp=85067432961&partnerID=8YFLogxK

U2 - 10.1002/adfm.201901327

DO - 10.1002/adfm.201901327

M3 - Article

AN - SCOPUS:85067432961

SN - 1616-301X

VL - 29

JO - Advanced Functional Materials

JF - Advanced Functional Materials

IS - 52

M1 - 1901327

ER -

Electron-Beam Manipulation of Silicon Impurities in Single-Walled Carbon Nanotubes

Austrian Fields of Science 2012

Keywords

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Atomic control over 2D materials via ion beam manipulation

ATMEN: Atomic precision materials engineering

In-situ investigation of stacked heteronanostructures

Cite this

Electron-Beam Manipulation of Silicon Impurities in Single-Walled Carbon Nanotubes

Austrian Fields of Science 2012

Keywords

Access to Document

Other files and links

Fingerprint

Projects

Atomic control over 2D materials via ion beam manipulation

ATMEN: Atomic precision materials engineering

In-situ investigation of stacked heteronanostructures

Cite this