Electron diffraction analysis of nanocrystalline Fe-Al

Christoph Gammer; Clemens Mangler; Christian Rentenberger; Hans-Peter Karnthaler

doi:10.1007/978-3-540-85226-1_213

Electron diffraction analysis of nanocrystalline Fe-Al

Christoph Gammer, Clemens Mangler, Christian Rentenberger, Hans-Peter Karnthaler (Corresponding author)

Physics of Nanostructured Materials

Publications: Contribution to book › Contribution to proceedings

Original language	English
Title of host publication	Proceedings of the 14th European Microscopy Congress
Subtitle of host publication	Materials Science
Editors	Silvia Richter, Alexander Schwedt
Place of Publication	Berlin
Publisher	Springer-Verlag Berlin-Heidelberg
Pages	425-426
Number of pages	2
Volume	2
ISBN (Electronic)	978-3-540-85226-1
ISBN (Print)	978-3-540-85225-4
DOIs	https://doi.org/10.1007/978-3-540-85226-1_213
Publication status	Published - 2008
Event	14th European Microscopy Congress - Aachen, Germany Duration: 1 Sept 2008 → 5 Sept 2008

Conference

Conference	14th European Microscopy Congress
Abbreviated title	EMC 2008
Country/Territory	Germany
City	Aachen
Period	1/09/08 → 5/09/08

Austrian Fields of Science 2012

103018 Materials physics

Access to Document

10.1007/978-3-540-85226-1_213

Cite this

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title = "Electron diffraction analysis of nanocrystalline Fe-Al",

author = "Christoph Gammer and Clemens Mangler and Christian Rentenberger and Hans-Peter Karnthaler",

note = "Host publication data : Proceedings of the 14th European Microscopy Congress; 14th European Microscopy Congress, EMC 2008 ; Conference date: 01-09-2008 Through 05-09-2008",

year = "2008",

doi = "10.1007/978-3-540-85226-1_213",

language = "English",

isbn = "978-3-540-85225-4",

volume = "2",

pages = "425--426",

editor = "Silvia Richter and Alexander Schwedt",

booktitle = "Proceedings of the 14th European Microscopy Congress",

publisher = "Springer-Verlag Berlin-Heidelberg",

}

Gammer, C, Mangler, C , Rentenberger, C & Karnthaler, H-P 2008, Electron diffraction analysis of nanocrystalline Fe-Al. in S Richter & A Schwedt (eds), Proceedings of the 14th European Microscopy Congress: Materials Science. vol. 2, Springer-Verlag Berlin-Heidelberg, Berlin, pp. 425-426, 14th European Microscopy Congress, Aachen, Germany, 1/09/08. https://doi.org/10.1007/978-3-540-85226-1_213

Electron diffraction analysis of nanocrystalline Fe-Al. / Gammer, Christoph; Mangler, Clemens ; Rentenberger, Christian et al.
Proceedings of the 14th European Microscopy Congress: Materials Science. ed. / Silvia Richter; Alexander Schwedt. Vol. 2 Berlin: Springer-Verlag Berlin-Heidelberg, 2008. p. 425-426.

Publications: Contribution to book › Contribution to proceedings

TY - GEN

T1 - Electron diffraction analysis of nanocrystalline Fe-Al

AU - Gammer, Christoph

AU - Mangler, Clemens

AU - Rentenberger, Christian

AU - Karnthaler, Hans-Peter

N1 - Host publication data : Proceedings of the 14th European Microscopy Congress

PY - 2008

Y1 - 2008

U2 - 10.1007/978-3-540-85226-1_213

DO - 10.1007/978-3-540-85226-1_213

M3 - Contribution to proceedings

SN - 978-3-540-85225-4

VL - 2

SP - 425

EP - 426

BT - Proceedings of the 14th European Microscopy Congress

A2 - Richter, Silvia

A2 - Schwedt, Alexander

PB - Springer-Verlag Berlin-Heidelberg

CY - Berlin

T2 - 14th European Microscopy Congress

Y2 - 1 September 2008 through 5 September 2008

ER -