Electron optics for a multi-pass transmission electron microscope

Marian Mankos (Corresponding author), Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich

Publications: Contribution to bookContribution to proceedingsPeer Reviewed


Multi-pass transmission electron microscopy is a novel technique that promises to reduce the required electron dose to the specimen for a desired signal-to-noise ratio by increasing the change to the phase of the electron wave that is imparted by the specimen. In this technique, the electron beam interacts elastically with the specimen multiple times so that the change in the phase accumulates before reaching the detector. Past simulations have predicted an improvement in resolution and sensitivity for a range of applications, and an order-of-magnitude reduction in damage at equivalent resolution. Here, the electron-optical design of a 10 keV multi-pass transmission electron microscope that is currently under construction is examined.

Original languageEnglish
Title of host publicationAdvances in Imaging and Electron Physics Including Proceedings CPO-10
EditorsPeter W. Hawkes, Martin Hÿtch
Place of PublicationLondon
PublisherAcademic Press
Number of pages16
ISBN (Electronic)978-0-12-817476-0
ISBN (Print)978-0-12-817475-3
Publication statusPublished - 2019
Event10th International Conference on Charged Particle Optics (CPO-10) - Key West, United States
Duration: 17 Oct 201821 Oct 2018

Publication series

SeriesAdvances in Imaging and Electron Physics


Conference10th International Conference on Charged Particle Optics (CPO-10)
Country/TerritoryUnited States
CityKey West

Austrian Fields of Science 2012

  • 103042 Electron microscopy


  • Cryo-electron microscopy
  • Electron mirror
  • Electron optics
  • Multi-pass electron microscopy

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