Electron optics for a multi-pass transmission electron microscope

Marian Mankos; Stewart A. Koppell; Brannon B. Klopfer; Thomas Juffmann; Vladimir Kolarik; Khashayar Shadman; Mark Kasevich

doi:10.1016/bs.aiep.2019.08.003

Electron optics for a multi-pass transmission electron microscope

Marian Mankos (Corresponding author)
, Stewart A. Koppell
, Brannon B. Klopfer
, Thomas Juffmann
, Vladimir Kolarik
, Khashayar Shadman
, Mark Kasevich

Quantum Science

Publications: Contribution to book › Contribution to proceedings › Peer Reviewed

Abstract

Multi-pass transmission electron microscopy is a novel technique that promises to reduce the required electron dose to the specimen for a desired signal-to-noise ratio by increasing the change to the phase of the electron wave that is imparted by the specimen. In this technique, the electron beam interacts elastically with the specimen multiple times so that the change in the phase accumulates before reaching the detector. Past simulations have predicted an improvement in resolution and sensitivity for a range of applications, and an order-of-magnitude reduction in damage at equivalent resolution. Here, the electron-optical design of a 10 keV multi-pass transmission electron microscope that is currently under construction is examined.

Original language	English
Title of host publication	Advances in Imaging and Electron Physics Including Proceedings CPO-10
Editors	Peter W. Hawkes, Martin Hÿtch
Place of Publication	London
Publisher	Academic Press
Chapter	4
Pages	71-86
Number of pages	16
ISBN (Electronic)	978-0-12-817476-0
ISBN (Print)	978-0-12-817475-3
DOIs	https://doi.org/10.1016/bs.aiep.2019.08.003
Publication status	Published - 2019
Event	10th International Conference on Charged Particle Optics (CPO-10) - Key West, United States Duration: 17 Oct 2018 → 21 Oct 2018

Publication series

Series	Advances in Imaging and Electron Physics
Volume	212
ISSN	1076-5670

Conference

Conference	10th International Conference on Charged Particle Optics (CPO-10)
Country/Territory	United States
City	Key West
Period	17/10/18 → 21/10/18

Funding

This work was done as part of the Quantum Electron Microscope collaboration funded by the Gordon and Betty Moore foundation. Brannon Klopfer acknowledges support from the Stanford Graduate Fellowship. Thomas Juffmann acknowledges support from the ERC Micromoupe Grant 758752.

Austrian Fields of Science 2012

103042 Electron microscopy

Keywords

Cryo-electron microscopy
Electron mirror
Electron optics
Multi-pass electron microscopy

Access to Document

10.1016/bs.aiep.2019.08.003

Cite this

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title = "Electron optics for a multi-pass transmission electron microscope",

abstract = "Multi-pass transmission electron microscopy is a novel technique that promises to reduce the required electron dose to the specimen for a desired signal-to-noise ratio by increasing the change to the phase of the electron wave that is imparted by the specimen. In this technique, the electron beam interacts elastically with the specimen multiple times so that the change in the phase accumulates before reaching the detector. Past simulations have predicted an improvement in resolution and sensitivity for a range of applications, and an order-of-magnitude reduction in damage at equivalent resolution. Here, the electron-optical design of a 10 keV multi-pass transmission electron microscope that is currently under construction is examined.",

keywords = "Cryo-electron microscopy, Electron mirror, Electron optics, Multi-pass electron microscopy",

author = "Marian Mankos and Koppell, \{Stewart A.\} and Klopfer, \{Brannon B.\} and Thomas Juffmann and Vladimir Kolarik and Khashayar Shadman and Mark Kasevich",

note = "Publisher Copyright: {\textcopyright} 2019 Elsevier Inc.; 10th International Conference on Charged Particle Optics (CPO-10) ; Conference date: 17-10-2018 Through 21-10-2018",

year = "2019",

doi = "10.1016/bs.aiep.2019.08.003",

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isbn = "978-0-12-817475-3",

series = "Advances in Imaging and Electron Physics",

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editor = "Hawkes, \{Peter W.\} and Martin H{\"y}tch",

booktitle = "Advances in Imaging and Electron Physics Including Proceedings CPO-10",

publisher = "Academic Press",

}

Mankos, M, Koppell, SA, Klopfer, BB, Juffmann, T, Kolarik, V, Shadman, K & Kasevich, M 2019, Electron optics for a multi-pass transmission electron microscope. in PW Hawkes & M Hÿtch (eds), Advances in Imaging and Electron Physics Including Proceedings CPO-10. Academic Press, London, Advances in Imaging and Electron Physics, vol. 212, pp. 71-86, 10th International Conference on Charged Particle Optics (CPO-10), Key West, United States, 17/10/18. https://doi.org/10.1016/bs.aiep.2019.08.003

Electron optics for a multi-pass transmission electron microscope. / Mankos, Marian (Corresponding author); Koppell, Stewart A.; Klopfer, Brannon B. et al.
Advances in Imaging and Electron Physics Including Proceedings CPO-10. ed. / Peter W. Hawkes; Martin Hÿtch. London: Academic Press, 2019. p. 71-86 (Advances in Imaging and Electron Physics, Vol. 212).

Publications: Contribution to book › Contribution to proceedings › Peer Reviewed

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AU - Juffmann, Thomas

AU - Kolarik, Vladimir

AU - Shadman, Khashayar

AU - Kasevich, Mark

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N2 - Multi-pass transmission electron microscopy is a novel technique that promises to reduce the required electron dose to the specimen for a desired signal-to-noise ratio by increasing the change to the phase of the electron wave that is imparted by the specimen. In this technique, the electron beam interacts elastically with the specimen multiple times so that the change in the phase accumulates before reaching the detector. Past simulations have predicted an improvement in resolution and sensitivity for a range of applications, and an order-of-magnitude reduction in damage at equivalent resolution. Here, the electron-optical design of a 10 keV multi-pass transmission electron microscope that is currently under construction is examined.

AB - Multi-pass transmission electron microscopy is a novel technique that promises to reduce the required electron dose to the specimen for a desired signal-to-noise ratio by increasing the change to the phase of the electron wave that is imparted by the specimen. In this technique, the electron beam interacts elastically with the specimen multiple times so that the change in the phase accumulates before reaching the detector. Past simulations have predicted an improvement in resolution and sensitivity for a range of applications, and an order-of-magnitude reduction in damage at equivalent resolution. Here, the electron-optical design of a 10 keV multi-pass transmission electron microscope that is currently under construction is examined.

KW - Cryo-electron microscopy

KW - Electron mirror

KW - Electron optics

KW - Multi-pass electron microscopy

UR - https://www.scopus.com/pages/publications/85072083579

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DO - 10.1016/bs.aiep.2019.08.003

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SN - 978-0-12-817475-3

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SP - 71

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ER -

Mankos M, Koppell SA, Klopfer BB, Juffmann T, Kolarik V, Shadman K et al. Electron optics for a multi-pass transmission electron microscope. In Hawkes PW, Hÿtch M, editors, Advances in Imaging and Electron Physics Including Proceedings CPO-10. London: Academic Press. 2019. p. 71-86. (Advances in Imaging and Electron Physics, Vol. 212). doi: 10.1016/bs.aiep.2019.08.003

Electron optics for a multi-pass transmission electron microscope

Abstract

Publication series

Conference

Funding

Austrian Fields of Science 2012

Keywords

Access to Document

Other files and links

Fingerprint

MicroMOUPE: Microscopy - Making optimal use of photons and electrons

Cite this

Electron optics for a multi-pass transmission electron microscope

Abstract

Publication series

Conference

Funding

Austrian Fields of Science 2012

Keywords

Access to Document

Other files and links

Fingerprint

Projects

MicroMOUPE: Microscopy - Making optimal use of photons and electrons

Cite this