Exploring Low-dimensional Carbon Materials by High-resolution Electron and Scanned Probe Microscopy

Jannik C. Meyer, Jani Kotakoski, Giacomo Argentero, Clemens Mangler, Bernhard Bayer, Christian Kramberger-Kaplan, Franz Eder, Stefan Hummel, Kenan Elibol, Andreas Mittelberger

Publications: Contribution to journalMeeting abstract/Conference paperPeer Reviewed

Abstract

Not Available
Original languageEnglish
Pages (from-to)1147-1148
JournalMicroscopy and Microanalysis
Volume21
Issue numberS3
DOIs
Publication statusPublished - 1 Aug 2015
EventMicroscopy and Microanalysis 2015 - Portland, United States
Duration: 2 Aug 20156 Aug 2015

Austrian Fields of Science 2012

  • 103042 Electron microscopy
  • 103009 Solid state physics

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