Full-field cavity enhanced microscopy techniques

Stefan Nimmrichter (Corresponding author), Chi-Fang Chen, Brannon B. Klopfer, Mark A. Kasevich, Thomas Juffmann

Publications: Contribution to journalArticlePeer Reviewed

Abstract

The number of probe particles that is detected on a single pixel of a micrograph is finite, either due to source (low power), detector (low dynamic range) or specimen damage constraints. The sensitivity of an otherwise perfect microscope is then limited by the statistical fluctuations in the number of detected particles. It is thus crucial to strive for the optimal signal-to-noise ratio per detected photon. Here we analytically and numerically compare three different contrast enhancing techniques that are all based on self-imaging cavities: CW cavity enhanced microscopy, cavity ring-down microscopy and multi-pass microscopy. We show that all three schemes can lead to sensitivities beyond those achievable with a single pass.
Original languageEnglish
Article number015007
Number of pages16
JournalJPhys Photonics
Volume1
Issue number1
Early online date6 Dec 2018
DOIs
Publication statusPublished - 6 Dec 2018

Austrian Fields of Science 2012

  • 103021 Optics

Keywords

  • multi-pass imaging
  • cavity-enhanced microscopy
  • contrast enhancement
  • optical imaging
  • Contrast enhancement
  • Optical imaging
  • Cavity-enhanced microscopy
  • Multi-pass imaging

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