High-Accuracy Measurement of Mid-IR Refractive Indices of GaAs/AlGaAs in Thin-Film Multilayers

Lukas W. Perner (Corresponding author)
, Georg Winkler
, Gar-Wing Truong
, David Follman
, Jakob Fellinger
, Maximilian Prinz
, Stephan Puchegger
, Garrett D. Cole
, Oliver H. Heckl

Faculty Center for Nano Structure Research

Publications: Contribution to book › Contribution to proceedings › Peer Reviewed

1 Finished

1 results

Filter

Finished

CDL Mid-IR: Christian Doppler Laboratory for Mid-IR Spectroscopy and Semiconductor Optics
Heckl, O. H. (Project Lead) & Simon, Y. (Admin)
1/01/17 → 29/02/24
Project: Research cooperation