Investigation of defect formation and electronic transport in microcrystalline silicon deposited by hot-wire CVD

M Stöger, A Breymesser, Viktor Schlosser, M Ramadori, V Plunger, D Peiró, C Voz, J Bertomeu, M Nelhiebel, Peter Schattschneider, J Andreu

    Publications: Contribution to journalArticlePeer Reviewed

    Original languageEnglish
    Pages (from-to)540-543
    Number of pages4
    JournalPhysica B: Condensed Matter
    Volume273-274
    DOIs
    Publication statusPublished - 1999

    Austrian Fields of Science 2012

    • 202032 Photovoltaics

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