Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM

A Breymesser, Viktor Schlosser, D Peiró, C Voz, J Bertomeu, J Andreu, J Summhammer

Publications: Contribution to journal › Article › Peer Reviewed

Original language	English
Pages (from-to)	171-177
Number of pages	7
Journal	Solar Energy Materials & Solar Cells
Volume	66
Issue number	1-4
DOIs	https://doi.org/10.1016/S0927-0248(00)00170-7
Publication status	Published - 2001

Austrian Fields of Science 2012

@article{995f75b8bc8b4fd9975bdcea7cc090ce,

title = "Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM",

author = "A Breymesser and Viktor Schlosser and D Peir{\'o} and C Voz and J Bertomeu and J Andreu and J Summhammer",

note = "29.10.2007: Datenanforderung 1949 (Import Sachbearbeiter)",

year = "2001",

doi = "10.1016/S0927-0248(00)00170-7",

language = "English",

volume = "66",

pages = "171--177",

journal = "Solar Energy Materials & Solar Cells",

issn = "0927-0248",

number = "1-4",

}

TY - JOUR

T1 - Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM

AU - Breymesser, A

AU - Schlosser, Viktor

AU - Peiró, D

AU - Voz, C

AU - Bertomeu, J

AU - Andreu, J

AU - Summhammer, J

N1 - 29.10.2007: Datenanforderung 1949 (Import Sachbearbeiter)

PY - 2001

Y1 - 2001

U2 - 10.1016/S0927-0248(00)00170-7

DO - 10.1016/S0927-0248(00)00170-7

M3 - Article

SN - 0927-0248

VL - 66

SP - 171

EP - 177

JO - Solar Energy Materials & Solar Cells

JF - Solar Energy Materials & Solar Cells

IS - 1-4

ER -