TY - JOUR
T1 - Palladium as a contact material for InSb semiconductors - The In-Pd-Sb phase diagram
AU - Luef, Christoph
AU - Flandorfer, Hans
AU - Richter, Klaus
AU - Ipser, Herbert
N1 - Coden: JECMA
Affiliations: Inst. für Anorganische Chemie, Universität Wien, A-1090 Wien, Austria
Adressen: Luef, C.; Inst. für Anorganische Chemie; Universität Wien A-1090 Wien, Austria; email: [email protected]
Source-File: MatChemScopus.csv
Import aus Scopus: 2-s2.0-0037324035
Importdatum: 09.01.2007 14:06:13
09.02.2010: Datenanforderung UNIVIS-DATEN-DAT.RA-2 (Import Sachbearbeiter)
PY - 2003
Y1 - 2003
N2 - The ternary In-Pd-Sb phase diagram was investigated in the compositional range up to approximately 60at.%Pd, covering the phase relationships of the compound semiconductor InSb. The investigation included differential thermal analyses (DTA), x-ray powder diffraction, and electron probe microanalyses (EPMA). The ternary equilibrium phase relations were studied for three isothermal sections at 300°C, 450°C, and 700°C, respectively. Nine invariant ternary-phase reactions were identified in the temperature range 150-750°C. A complete reaction scheme was constructed in the corresponding composition range, and the liquidus surface was derived from DTA data. In addition, six isopleths were constructed from the combined data.
AB - The ternary In-Pd-Sb phase diagram was investigated in the compositional range up to approximately 60at.%Pd, covering the phase relationships of the compound semiconductor InSb. The investigation included differential thermal analyses (DTA), x-ray powder diffraction, and electron probe microanalyses (EPMA). The ternary equilibrium phase relations were studied for three isothermal sections at 300°C, 450°C, and 700°C, respectively. Nine invariant ternary-phase reactions were identified in the temperature range 150-750°C. A complete reaction scheme was constructed in the corresponding composition range, and the liquidus surface was derived from DTA data. In addition, six isopleths were constructed from the combined data.
M3 - Article
SN - 0361-5235
VL - 32
SP - 43
EP - 51
JO - Journal of Electronic Materials
JF - Journal of Electronic Materials
IS - 2
ER -