| Original language | English |
|---|---|
| Article number | 2003300 |
| Number of pages | 11 |
| Journal | Advanced Functional Materials |
| Volume | 30 |
| Issue number | 34 |
| Early online date | 24 Jun 2020 |
| DOIs | |
| Publication status | Published - 19 Aug 2020 |
Funding
B.C.B., K.E., and C.M. acknowledge support from the Austrian Research Promotion Agency (FFG) under project 860382-VISION. J.K. acknowledges funding from the Austrian Science Fund (FWF) through project I3181-N36. The authors also acknowledge use of the facilities at the University Service Centre for Transmission Electron Microscopy (USTEM), Vienna University of Technology (TU Wien), Austria for parts of this work.
Austrian Fields of Science 2012
- 103042 Electron microscopy
- 104011 Materials chemistry
- 103018 Materials physics
Keywords
- aberration-corrected scanning transmission electron microscopy
- graphene
- in situ
- indium oxide
- non-2D
- 2D heterostructures
- ATOMIC LAYER DEPOSITION
- GAS SENSOR
- INDIUM NANOPARTICLES
- METAL-OXIDES
- GROWTH
- IN2O3
- NO2
- NANOCRYSTALS
- MONOLAYER
- PARTICLES
- non-2D/2D heterostructures
Fingerprint
Dive into the research topics of 'Process Pathway Controlled Evolution of Phase and Van-der-Waals Epitaxy in In/In2O3on Graphene Heterostructures'. Together they form a unique fingerprint.Projects
- 1 Finished
-
In-situ investigation of stacked heteronanostructures
Kotakoski, J. (Project Lead)
1/06/17 → 31/03/21
Project: Research funding
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