TY - JOUR
T1 - Scanning photoelectron spectromicroscopy: From static to operando studies of functional materials
AU - Amati, M.
AU - Susi, Toma
AU - Jovičević-Klug, P.
AU - Jovičević-Klug, M.
AU - Kosmala, Tomasz
AU - Granozzi, Gaetano
AU - Agnoli, Stefano
AU - Yang, Pengfei
AU - Zhang, Yanfeng
AU - Scardamaglia, Mattia
AU - Gregoratti, L.
N1 - Publisher Copyright:
© 2023 Elsevier B.V.
PY - 2023/5
Y1 - 2023/5
N2 - The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone Trieste the present review demonstrates the current potential of this type of photoelectron spectromicroscopy to explore the interfacial properties of functional materials with high spatial resolution.
AB - The scanning photoelectron microscope (SPEM), developed more than 30 years ago, has undergone numerous technical developments, providing an incredibly vast kind of feasible sample environments, which span from the traditional high spatial resolution core level based chemical analysis to insitu and operando complex experiments, including also electrochemical setups and operational electronic devices at various temperatures. Another important step ahead is overcoming the so-called pressure gap for operando studies, recently extended to near ambient values by building special environmental cells. Using recent results of conventional and unconventional experiments, obtained with SPEM at the ESCA Microscopy beamline at Elettra Sincrotrone Trieste the present review demonstrates the current potential of this type of photoelectron spectromicroscopy to explore the interfacial properties of functional materials with high spatial resolution.
KW - Deep cryogenic treatment
KW - Graphene
KW - Scanning photoelectron spectromicroscopy
KW - Surface science
KW - Transition metal chalcogenides
UR - http://www.scopus.com/inward/record.url?scp=85162924227&partnerID=8YFLogxK
U2 - 10.1016/j.elspec.2023.147336
DO - 10.1016/j.elspec.2023.147336
M3 - Article
AN - SCOPUS:85162924227
SN - 0368-2048
VL - 265
JO - Journal of Electron Spectroscopy and Related Phenomena
JF - Journal of Electron Spectroscopy and Related Phenomena
M1 - 147336
ER -