Software electron counting for low-dose scanning transmission electron microscopy

Andreas Mittelberger; Christian Kramberger; Jannik C. Meyer

doi:10.1016/j.ultramic.2018.02.005

Software electron counting for low-dose scanning transmission electron microscopy

Andreas Mittelberger (Corresponding author), Christian Kramberger, Jannik C. Meyer (Corresponding author)

Physics of Nanostructured Materials

Publications: Contribution to journal › Article › Peer Reviewed

Original language	English
Pages (from-to)	1-7
Number of pages	7
Journal	Ultramicroscopy
Volume	188
DOIs	https://doi.org/10.1016/j.ultramic.2018.02.005
Publication status	Published - May 2018

Austrian Fields of Science 2012

103042 Electron microscopy

Keywords

Electron counting
Low-dose
STEM
Single electron signal
PARTICLE CRYO-EM
RADIATION-DAMAGE
ATOMIC-RESOLUTION
KV
EXPOSURES
SPECIMENS
GRAPHENE
MOTION
TEM

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10.1016/j.ultramic.2018.02.005Licence: CC BY 4.0

Cite this

@article{6ec0de4156834fee93ce9edbb678df35,

title = "Software electron counting for low-dose scanning transmission electron microscopy",

keywords = "Electron counting, Low-dose, STEM, Single electron signal, PARTICLE CRYO-EM, RADIATION-DAMAGE, ATOMIC-RESOLUTION, KV, EXPOSURES, SPECIMENS, GRAPHENE, MOTION, TEM",

author = "Andreas Mittelberger and Christian Kramberger and Meyer, {Jannik C.}",

note = "Publisher Copyright: {\textcopyright} 2018 The Authors",

year = "2018",

month = may,

doi = "10.1016/j.ultramic.2018.02.005",

language = "English",

volume = "188",

pages = "1--7",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "ELSEVIER SCIENCE BV",

}

TY - JOUR

T1 - Software electron counting for low-dose scanning transmission electron microscopy

AU - Mittelberger, Andreas

AU - Kramberger, Christian

AU - Meyer, Jannik C.

PY - 2018/5

Y1 - 2018/5

KW - Electron counting

KW - Low-dose

KW - STEM

KW - Single electron signal

KW - PARTICLE CRYO-EM

KW - RADIATION-DAMAGE

KW - ATOMIC-RESOLUTION

KW - KV

KW - EXPOSURES

KW - SPECIMENS

KW - GRAPHENE

KW - MOTION

KW - TEM

UR - http://www.scopus.com/inward/record.url?scp=85042460142&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2018.02.005

DO - 10.1016/j.ultramic.2018.02.005

M3 - Article

VL - 188

SP - 1

EP - 7

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

ER -

Software electron counting for low-dose scanning transmission electron microscopy

Austrian Fields of Science 2012

Keywords

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PICOMAT: Picometer scale insight and manipulation of novel materials

Cite this

Software electron counting for low-dose scanning transmission electron microscopy

Austrian Fields of Science 2012

Keywords

Access to Document

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PICOMAT: Picometer scale insight and manipulation of novel materials

Cite this