Understanding and Exploiting the Interaction of Electron Beams With Low-dimensional Materials - From Controlled Atomic-level Manipulation to Circumventing Radiation Damage

T. Susi, A. Mittelberger, C. Kramberger, C. Mangler, C. Hofer, T. J. Pennycook, J. Kotakoski, J. C. Meyer

Publications: Contribution to journalMeeting abstract/Conference paperPeer Reviewed

Abstract

Not Available
Original languageEnglish
Pages (from-to)196-197
Number of pages2
JournalMicroscopy and Microanalysis
Volume23
Issue numberS1
DOIs
Publication statusPublished - 1 Jul 2017
EventMicroscopy and Microanalysis 2017 - St. Louis, United States
Duration: 6 Aug 201710 Aug 2017

Austrian Fields of Science 2012

  • 103018 Materials physics
  • 103009 Solid state physics
  • 103042 Electron microscopy

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