Vacancy concentrations determined from the diffuse background scattering of X-rays in plastically deformed copper

T. Ungar (Corresponding author), E. Schafler, P. Hanak, S. Bernstorff, M. Zehetbauer

    Publications: Contribution to journalArticlePeer Reviewed

    Original languageEnglish
    Pages (from-to)578-583
    Number of pages6
    JournalInternational Journal of Materials Research
    Volume96
    Issue number6
    DOIs
    Publication statusPublished - 2005

    Austrian Fields of Science 2012

    • 103018 Materials physics
    • 211104 Metallurgy

    Keywords

    • Vacancy concentration
    • Dislocations
    • X-ray line-profile analysis
    • in-situ compression
    • RANGE INTERNAL-STRESSES
    • DISLOCATION-STRUCTURE
    • SINGLE-CRYSTALS
    • DEFORMATION
    • DEFECTS

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