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When higher resolution reduces precision: quantum limits of off-axis interferometric scattering microscopy

  • Felix Hitzelhammer (Corresponding author)
  • , Jonathan Dong
  • , Ulrich Hohenester
  • , Thomas Juffmann

Publications: Contribution to journal › Article › Peer Reviewed

Abstract

Coherent interferometric scattering microscopy (i scat) enables nanoparticle tracking on microsecond timescales and with nanometer precision, and has become a key tool in structural and cellular biophysics. The achievable localization precision in such experiments is fundamentally limited by photon shot noise. Here, we analyze three-dimensional localization precision for spherical subwavelength scatterers in a homogeneous medium under oblique illumination in iscat using the framework of (Quantum) Fisher information. We show that tilting the illumination can enhance localization precision and accuracy per detected photon, while increasing robustness to defocusing. Surprisingly, rotating coherent scattering microscopy, which incoherently averages oblique illuminations, achieves higher spatial resolution but lower localization precision. Our results establish the quantum limits of off-axis interferometric imaging and reveal that resolution and precision can behave in opposite ways—a key insight for designing next-generation coherent microscopes.
Original languageEnglish
Article number025008
Number of pages10
JournalJPhys Photonics
Volume8
Issue number2
DOIs
Publication statusPublished - Jun 2026

Funding

This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (Grant Agreement No. 758752) and the Swiss National Science Foundation (Grant PZ00P2_216211). The authors acknowledge the financial support by the University of Graz.

FundersFunder number
European Research Council758752

    Austrian Fields of Science 2012

    • 103021 Optics

    Keywords

    • coherent optical microscopy
    • Fisher information
    • Fisher information flow
    • interferometric scattering microscopy
    • off-axis illumination

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